TY - JOUR
T1 - Combined TLP/RF testing system for detection of ESD failures in RF circuits
AU - Hyvonen, Sami
AU - Joshi, Sopan
AU - Rosenbaum, Elyze
N1 - Funding Information:
Dr. Joshi has been the recipient of a National Merit Scholarship at Stanford University, the E. A. Reid Fellowship from the University of Illinois, and a Best Student Paper award from the EOS/ESD Symposium.
Funding Information:
Manuscript received October 7, 2003; revised February 2, 2004 and September 22 , 2004. This work was supported by the Semiconductor Research Corporation. S. Hyvonen and S. Joshi are with the Intel Corporation, Hillsboro, OR 97124 USA (e-mail: hyvonen@ieee.org). E. Rosenbaum is with the Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801 USA. Digital Object Identifier 10.1109/TEPM.2005.854142
PY - 2005/7
Y1 - 2005/7
N2 - We present a modified transmission-line pulse (TLP) measurement system in which radio frequency (RF) functionality tests, along with the conventional leakage current measurement, are performed after each pulse to detect failure. Measurement results from 5-GHz low-noise amplifiers (LNAs) show that RF metrics degrade before the leakage current increases. Also, we introduce an electrostatic discharge (ESD)-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.
AB - We present a modified transmission-line pulse (TLP) measurement system in which radio frequency (RF) functionality tests, along with the conventional leakage current measurement, are performed after each pulse to detect failure. Measurement results from 5-GHz low-noise amplifiers (LNAs) show that RF metrics degrade before the leakage current increases. Also, we introduce an electrostatic discharge (ESD)-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.
KW - Electrostatic discharge (ESD) measurement
KW - Low-noise amplifier (LNA)
KW - Radio frequency (RF) circuits
KW - Transmission line pulse (TLP)
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U2 - 10.1109/TEPM.2005.854142
DO - 10.1109/TEPM.2005.854142
M3 - Article
AN - SCOPUS:27844593294
SN - 1521-334X
VL - 28
SP - 224
EP - 230
JO - IEEE Transactions on Electronics Packaging Manufacturing
JF - IEEE Transactions on Electronics Packaging Manufacturing
IS - 3
ER -