Combined TLP/RF testing system for detection of ESD failures in RF circuits

Sami Hyvonen, Sopan Joshi, Elyze Rosenbaum

Research output: Contribution to journalArticle

Abstract

We present a modified transmission-line pulse (TLP) measurement system in which radio frequency (RF) functionality tests, along with the conventional leakage current measurement, are performed after each pulse to detect failure. Measurement results from 5-GHz low-noise amplifiers (LNAs) show that RF metrics degrade before the leakage current increases. Also, we introduce an electrostatic discharge (ESD)-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.

Original languageEnglish (US)
Pages (from-to)224-230
Number of pages7
JournalIEEE Transactions on Electronics Packaging Manufacturing
Volume28
Issue number3
DOIs
StatePublished - Jul 1 2005

Keywords

  • Electrostatic discharge (ESD) measurement
  • Low-noise amplifier (LNA)
  • Radio frequency (RF) circuits
  • Transmission line pulse (TLP)

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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