Combined HREM and quantitative electron diffraction characterization of individual Pd2Si nanostructures on Si(111) surfaces

B. Q. Li; J. M. Zuo

doi:10.1017/s1431927603441408

Combined HREM and quantitative electron diffraction characterization of individual Pd₂Si nanostructures on Si(111) surfaces

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	280-281
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927603441408
State	Published - 2003

ASJC Scopus subject areas

Instrumentation

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10.1017/s1431927603441408

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title = "Combined HREM and quantitative electron diffraction characterization of individual Pd2Si nanostructures on Si(111) surfaces",

author = "Li, {B. Q.} and Zuo, {J. M.}",

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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