Combating aging with the colt duty cycle equalizer

Erika Gunadi, Abhisek A. Sinkar, Nam Sung Kim, Mikko H. Lipasti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. The design guardband to counter these negative effects will be too expensive, largely due to the worst-case behavior induced by the uneven utilization of devices on the chip. To mitigate these effects over a chip's lifetime, this paper proposes Colt, a simple yet holistic scheme to balance the utilization of devices in a processor by equalizing the duty cycle ratio of circuits' internal nodes and the usage frequency of devices. Colt relies on alternating true-and complement-mode operations to equalize the duty cycle ratio of signals (thus the utilization of devices) in most data path and storage devices. Colt also employs a pseudorandom indexing scheme to balance the usage of entries in storage structures that often exhibit highly uneven utilization of entries. Finally, an operand-swapping scheme equalizes utilization of the left and right operand data paths. The proposed mechanisms impose trivial overhead in area, complexity, power, and performance, while recapturing 27% of aging-induced performance degradation and improving mean time to failure by an estimated 40%.

Original languageEnglish (US)
Title of host publicationProceedings - 43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010
Pages103-114
Number of pages12
DOIs
StatePublished - Dec 1 2010
Event43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010 - Atlanta, GA, United States
Duration: Dec 4 2010Dec 8 2010

Publication series

NameProceedings of the Annual International Symposium on Microarchitecture, MICRO
ISSN (Print)1072-4451

Other

Other43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010
CountryUnited States
CityAtlanta, GA
Period12/4/1012/8/10

Keywords

  • BTI
  • Design
  • Gate oxide wearout
  • HCI
  • Reliability

ASJC Scopus subject areas

  • Hardware and Architecture

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  • Cite this

    Gunadi, E., Sinkar, A. A., Kim, N. S., & Lipasti, M. H. (2010). Combating aging with the colt duty cycle equalizer. In Proceedings - 43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010 (pp. 103-114). [5695529] (Proceedings of the Annual International Symposium on Microarchitecture, MICRO). https://doi.org/10.1109/MICRO.2010.37