Circuit-level electrothermal simulation techniques for designing output protection devices

Sridhar Ramaswamy, Elyse Rosenbaum, Sung Mo Kang

Research output: Contribution to conferencePaper

Abstract

The design of I/O protection circuits is crucial for the reliable operation of integrated circuits. Typical protection circuits are designed to meet certain specifications (ESD/EOS failure levels) and the use of CAD tools in the design stage will help in their characterization and design. We recently developed a circuit-level electrothermal simulator, iETSIM, which we have used to study different protection circuit designs. iETSIM solves the heat diffusion equation simultaneously with the device electrical equations. The device models extend to the avalanche breakdown regime. We show that the circuit-level electrothermal simulator can be a useful tool for designing reliable output protection devices.

Original languageEnglish (US)
Pages79-82
Number of pages4
StatePublished - Dec 1 1994
EventProceedings of the 1994 International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA
Duration: Oct 16 1994Oct 19 1994

Other

OtherProceedings of the 1994 International Integrated Reliability Workshop Final Report
CityLake Tahoe, CA, USA
Period10/16/9410/19/94

ASJC Scopus subject areas

  • Engineering(all)

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    Ramaswamy, S., Rosenbaum, E., & Kang, S. M. (1994). Circuit-level electrothermal simulation techniques for designing output protection devices. 79-82. Paper presented at Proceedings of the 1994 International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA, .