@inproceedings{45f50f32804b4af8ba28c571ffdbd861,
title = "Chip-level ESD-induced noise on internally and externally regulated power supplies",
abstract = "Power integrity during system-level ESD is studied on two test chips that have different integrated voltage regulator designs. On-chip voltage regulation can provide increased immunity to ESD-induced noise, especially if the internally-generated power supply does not utilize any off-chip decoupling capacitors.",
author = "Yang Xiu and Nicholas Thomson and Robert Mertens and Collin Reiman and Elyse Rosenbaum",
year = "2017",
month = oct,
day = "18",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2017, EOS/ESD 2017",
note = "39th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2017 ; Conference date: 10-09-2017 Through 14-09-2017",
}