Chemical characterization of bulk steel-bulk fluoropolymer interfaces

O. Cervantes, R. Haasch, Paul V Braun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Understanding the parameters that influence the strength of the interfacial adhesion between a metal and a polymer is of extreme importance for many industrial applications. It has been observed that the mechanical behavior of steel/fluoropolymer (S/F) interfaces is highly dependent on the chemistry of the interface. In this work, the chemical composition of a S/F interface is studied in an attempt to understand the relationship between the steel and the fluoropolymer and it's affect on the bond strength. Since the actual interface is quite thin, new sample preparation techniques were developed to expose the interface without introducing artifacts. Using these sample preparation techniques detailed morphological studies of the interface were performed using Scanning Electron Microscopy (SEM), which showed that the S/F interface exhibits significant roughness that may enable mechanical anchoring to occur in the interface. To determine the chemical composition of the interface, and the binding states of fluorine and carbon across the interface, Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) characterization techniques were used, respectively. Both SEM and AES indicated the presence of an oxide layer on the metal of approximately 200 nm. Additionally, XPS revealed the presence of metal fluorides at the interface, and suggested that both metal fluoride formation and the metal oxide layer are necessary for a strong S/F bond, however more studies are required to completely understand the effect of metal oxides and metal fluorides on bond strength.

Original languageEnglish (US)
Title of host publicationInternational SAMPE Technical Conference
EditorsA. Falcone, K.M. Nelson, R. Alvers, W.B. Avery
Pages1037-1049
Number of pages13
Volume33
StatePublished - 2001
Event33rd International SAMPE Technical Conference -Advancing Affordable Materials Technology- - Seattle, WA, United States
Duration: Nov 5 2001Nov 8 2001

Other

Other33rd International SAMPE Technical Conference -Advancing Affordable Materials Technology-
Country/TerritoryUnited States
CitySeattle, WA
Period11/5/0111/8/01

Keywords

  • AES
  • Fluoropolymer
  • Interface
  • Steel
  • XPS

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Chemical Engineering (miscellaneous)
  • Building and Construction
  • Polymers and Plastics

Fingerprint

Dive into the research topics of 'Chemical characterization of bulk steel-bulk fluoropolymer interfaces'. Together they form a unique fingerprint.

Cite this