TY - JOUR
T1 - Charge-injection device detection for improved performance in atomic-emission spectroscopy
AU - Pomeroy, Robert S.
AU - Sweedler, Jonathan V.
AU - Denton, M. Bonner
N1 - Funding Information:
Acknowledgements-Thea uthors gratefully acknowledge the work of Dr. Robert Bilhorn of Eastman Kodak (Rochester,N Y) and Dr. Gary Sims of PhotometricsL td (Tucson,A Z) on developingC IDAES systemsT. his work has been partially funded by SmithKline Beckman,t he Officeo f Naval Researcht,h eA nalyticalT echnologiesD ivi-sion of EastmanK odak, and the AnalyticalD ivision of the AmericanC hemicalS ocietyS ummerF ellowships ponsored by the Society of the Analytical Chemistso f Pittsburgh.
PY - 1990/1
Y1 - 1990/1
N2 - Studies into the use of simultaneous multiwavelength detection over a broad wavelength region (220-520 nm) demonstrate the power and flexibility offered by a charge-injection device for detection in atomic-emission spectrometry. An echelle monochromator and a charge-injection device utilizing the general electric CID17B array detector are used in conjunction with a direct current plasma source to perform multi-line analysis for Mg, Sr, Fe, Dy, Ho and Yb, increasing the sensitivity and limits of detection. By monitoring the 341-nm OH band and background Ar emission lines, changes in the nebulization and excitation conditions are easily detected. The presence of an organic matrix component not present in the standards is detected by observing the C(I) emission at 247.8 nm. These diagnostic tools can be combined with the use of an internal standard to obtain a reliability not previously available in automated AES instrumentation.
AB - Studies into the use of simultaneous multiwavelength detection over a broad wavelength region (220-520 nm) demonstrate the power and flexibility offered by a charge-injection device for detection in atomic-emission spectrometry. An echelle monochromator and a charge-injection device utilizing the general electric CID17B array detector are used in conjunction with a direct current plasma source to perform multi-line analysis for Mg, Sr, Fe, Dy, Ho and Yb, increasing the sensitivity and limits of detection. By monitoring the 341-nm OH band and background Ar emission lines, changes in the nebulization and excitation conditions are easily detected. The presence of an organic matrix component not present in the standards is detected by observing the C(I) emission at 247.8 nm. These diagnostic tools can be combined with the use of an internal standard to obtain a reliability not previously available in automated AES instrumentation.
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U2 - 10.1016/0039-9140(90)80042-E
DO - 10.1016/0039-9140(90)80042-E
M3 - Article
AN - SCOPUS:0347854390
SN - 0039-9140
VL - 37
SP - 15
EP - 21
JO - Talanta
JF - Talanta
IS - 1
ER -