@inproceedings{25b7262d71d047009725080b1658739d,
title = "Characterizing microdroplet evaporation using diffraction phase microscopy",
abstract = "Diffraction phase microscopy is a non-destructive in-situ characterization tool with nanometer height resolution that can measure 3-dimensional topography. We apply it to characterize microdroplets during evaporation without any a priori assumptions about the droplet geometry.",
author = "Chris Edwards and Amir Arbabi and Basanta Bhaduri and Raman Ganti and Yunker, {Peter J.} and Yodh, {Arjun G.} and Gabriel Popescu and Goddard, {Lynford L.}",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 27th IEEE Photonics Conference, IPC 2014 ; Conference date: 12-10-2014 Through 16-10-2014",
year = "2014",
month = dec,
day = "22",
doi = "10.1109/IPCon.2014.6995306",
language = "English (US)",
series = "2014 IEEE Photonics Conference, IPC 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "178--179",
booktitle = "2014 IEEE Photonics Conference, IPC 2014",
address = "United States",
}