Characterizing microdroplet evaporation using diffraction phase microscopy

Chris Edwards, Amir Arbabi, Basanta Bhaduri, Raman Ganti, Peter J. Yunker, Arjun G. Yodh, Gabriel Popescu, Lynford L Goddard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Diffraction phase microscopy is a non-destructive in-situ characterization tool with nanometer height resolution that can measure 3-dimensional topography. We apply it to characterize microdroplets during evaporation without any a priori assumptions about the droplet geometry.

Original languageEnglish (US)
Title of host publication2014 IEEE Photonics Conference, IPC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages178-179
Number of pages2
ISBN (Electronic)9781457715044
DOIs
StatePublished - Dec 22 2014
Event27th IEEE Photonics Conference, IPC 2014 - San Diego, United States
Duration: Oct 12 2014Oct 16 2014

Publication series

Name2014 IEEE Photonics Conference, IPC 2014

Other

Other27th IEEE Photonics Conference, IPC 2014
CountryUnited States
CitySan Diego
Period10/12/1410/16/14

Fingerprint

Topography
Microscopic examination
topography
Evaporation
Diffraction
evaporation
microscopy
Geometry
geometry
diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Edwards, C., Arbabi, A., Bhaduri, B., Ganti, R., Yunker, P. J., Yodh, A. G., ... Goddard, L. L. (2014). Characterizing microdroplet evaporation using diffraction phase microscopy. In 2014 IEEE Photonics Conference, IPC 2014 (pp. 178-179). [6995306] (2014 IEEE Photonics Conference, IPC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPCon.2014.6995306

Characterizing microdroplet evaporation using diffraction phase microscopy. / Edwards, Chris; Arbabi, Amir; Bhaduri, Basanta; Ganti, Raman; Yunker, Peter J.; Yodh, Arjun G.; Popescu, Gabriel; Goddard, Lynford L.

2014 IEEE Photonics Conference, IPC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 178-179 6995306 (2014 IEEE Photonics Conference, IPC 2014).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Edwards, C, Arbabi, A, Bhaduri, B, Ganti, R, Yunker, PJ, Yodh, AG, Popescu, G & Goddard, LL 2014, Characterizing microdroplet evaporation using diffraction phase microscopy. in 2014 IEEE Photonics Conference, IPC 2014., 6995306, 2014 IEEE Photonics Conference, IPC 2014, Institute of Electrical and Electronics Engineers Inc., pp. 178-179, 27th IEEE Photonics Conference, IPC 2014, San Diego, United States, 10/12/14. https://doi.org/10.1109/IPCon.2014.6995306
Edwards C, Arbabi A, Bhaduri B, Ganti R, Yunker PJ, Yodh AG et al. Characterizing microdroplet evaporation using diffraction phase microscopy. In 2014 IEEE Photonics Conference, IPC 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 178-179. 6995306. (2014 IEEE Photonics Conference, IPC 2014). https://doi.org/10.1109/IPCon.2014.6995306
Edwards, Chris ; Arbabi, Amir ; Bhaduri, Basanta ; Ganti, Raman ; Yunker, Peter J. ; Yodh, Arjun G. ; Popescu, Gabriel ; Goddard, Lynford L. / Characterizing microdroplet evaporation using diffraction phase microscopy. 2014 IEEE Photonics Conference, IPC 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 178-179 (2014 IEEE Photonics Conference, IPC 2014).
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