Characterizing microdroplet evaporation using diffraction phase microscopy

Chris Edwards, Amir Arbabi, Basanta Bhaduri, Raman Ganti, Peter J. Yunker, Arjun G. Yodh, Gabriel Popescu, Lynford L. Goddard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Diffraction phase microscopy is a non-destructive in-situ characterization tool with nanometer height resolution that can measure 3-dimensional topography. We apply it to characterize microdroplets during evaporation without any a priori assumptions about the droplet geometry.

Original languageEnglish (US)
Title of host publication2014 IEEE Photonics Conference, IPC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages178-179
Number of pages2
ISBN (Electronic)9781457715044
DOIs
StatePublished - Dec 22 2014
Event27th IEEE Photonics Conference, IPC 2014 - San Diego, United States
Duration: Oct 12 2014Oct 16 2014

Publication series

Name2014 IEEE Photonics Conference, IPC 2014

Other

Other27th IEEE Photonics Conference, IPC 2014
CountryUnited States
CitySan Diego
Period10/12/1410/16/14

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Edwards, C., Arbabi, A., Bhaduri, B., Ganti, R., Yunker, P. J., Yodh, A. G., Popescu, G., & Goddard, L. L. (2014). Characterizing microdroplet evaporation using diffraction phase microscopy. In 2014 IEEE Photonics Conference, IPC 2014 (pp. 178-179). [6995306] (2014 IEEE Photonics Conference, IPC 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPCon.2014.6995306