Characterization of the error resiliency of power grid substation devices

Kuan Yu Tseng, Daniel Chen, Zbigniew Kalbarczyk, Ravishankar K. Iyer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the advent of modern technologies, microprocessor-based devices are used to monitor and control critical infrastructures, e.g., electric power grids, oil and gas distribution. However, the security and reliability of these microprocessor-based systems is a significant issue, since they are more susceptible to transient errors and malicious attacks. An error in one of these systems could have a cascading and catastrophic impact on the whole infrastructure. This paper explores the error resiliency of power grid substation devices. A software-implemented fault injection technique is used to induce errors/faults inside devices used in power grid substations. The goal is to test the ability of these systems to compute through errors/faults. Our results demonstrate that a single error in a substation device may render the operator in the control center unable to control the operation of a relay in the substation.

Original languageEnglish (US)
Title of host publication2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012
DOIs
StatePublished - Oct 1 2012
Event42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012 - Boston, MA, United States
Duration: Jun 25 2012Jun 28 2012

Publication series

NameProceedings of the International Conference on Dependable Systems and Networks

Other

Other42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012
CountryUnited States
CityBoston, MA
Period6/25/126/28/12

Keywords

  • fault injection
  • power grid
  • reliability
  • security

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Computer Networks and Communications

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