TY - GEN
T1 - Characterization of the error resiliency of power grid substation devices
AU - Tseng, Kuan Yu
AU - Chen, Daniel
AU - Kalbarczyk, Zbigniew
AU - Iyer, Ravishankar K.
PY - 2012
Y1 - 2012
N2 - With the advent of modern technologies, microprocessor-based devices are used to monitor and control critical infrastructures, e.g., electric power grids, oil and gas distribution. However, the security and reliability of these microprocessor-based systems is a significant issue, since they are more susceptible to transient errors and malicious attacks. An error in one of these systems could have a cascading and catastrophic impact on the whole infrastructure. This paper explores the error resiliency of power grid substation devices. A software-implemented fault injection technique is used to induce errors/faults inside devices used in power grid substations. The goal is to test the ability of these systems to compute through errors/faults. Our results demonstrate that a single error in a substation device may render the operator in the control center unable to control the operation of a relay in the substation.
AB - With the advent of modern technologies, microprocessor-based devices are used to monitor and control critical infrastructures, e.g., electric power grids, oil and gas distribution. However, the security and reliability of these microprocessor-based systems is a significant issue, since they are more susceptible to transient errors and malicious attacks. An error in one of these systems could have a cascading and catastrophic impact on the whole infrastructure. This paper explores the error resiliency of power grid substation devices. A software-implemented fault injection technique is used to induce errors/faults inside devices used in power grid substations. The goal is to test the ability of these systems to compute through errors/faults. Our results demonstrate that a single error in a substation device may render the operator in the control center unable to control the operation of a relay in the substation.
KW - fault injection
KW - power grid
KW - reliability
KW - security
UR - http://www.scopus.com/inward/record.url?scp=84866714219&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84866714219&partnerID=8YFLogxK
U2 - 10.1109/DSN.2012.6263924
DO - 10.1109/DSN.2012.6263924
M3 - Conference contribution
AN - SCOPUS:84866714219
SN - 9781467316248
T3 - Proceedings of the International Conference on Dependable Systems and Networks
BT - 2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012
T2 - 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012
Y2 - 25 June 2012 through 28 June 2012
ER -