Characterization of scattering from nanoparticles using far-field interferometric microscopy

Brynmor J. Davis, P. Scott Carney

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Analysis and simulations show that coherent confocal microscopy techniques, such as Optical Coherence Microscopy, can be used to estimate the polarizability tensor of an imaged nanoparticle. The estimation process is robust to noise and defocus.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2008
PublisherOptical Society of America
ISBN (Print)9781557528612
StatePublished - 2008
EventFrontiers in Optics, FiO 2008 - Rochester, NY, United States
Duration: Oct 19 2008Oct 23 2008

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


OtherFrontiers in Optics, FiO 2008
Country/TerritoryUnited States
CityRochester, NY

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics


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