Characterization of nanometer-sized, mechanically exfoliated graphene on the H-passivated Si(100) surface using scanning tunneling microscopy

Kyle A. Ritter, Joseph W Lyding

Research output: Contribution to journalArticle

Abstract

We have developed a method for depositing graphene monolayers and bilayers with minimum lateral dimensions of 2-10 nm by the mechanical exfoliation of graphite onto the Si(100)-2 × 1:H surface. Room temperature, ultrahigh vacuum tunneling spectroscopy measurements of nanometer-sized single layer graphene reveal a size-dependent energy gap ranging from 0.1 to 1 eV. Furthermore, the number of graphene layers can be directly determined from scanning tunneling microscopy topographic contours. This atomistic study provides an experimental basis for probing the electronic structure of nanometer-sized graphene which can assist the development of graphene-based nanoelectronics.

Original languageEnglish (US)
Article number015704
JournalNanotechnology
Volume19
Issue number1
DOIs
StatePublished - Jan 9 2008

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Graphite
Scanning tunneling microscopy
Graphene
Nanoelectronics
Ultrahigh vacuum
Electronic structure
Monolayers
Energy gap
Spectroscopy
Temperature

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

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