Characterization of intermittent contact in tapping mode atomic force microscopy

Xiaopeng Zhao, Harry Dankowicz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and subsurface properties of numerous materials in a variety of environments. Strongly nonlinear effects due to large variations in the force field on the probe tip over very small length scales and the intermittency of contact with the sample, however, result in strong dynamical instabilities. These can result in a sudden loss of stability of low-contact-velocity oscillations of the atomic-force-microscope tip in favor of oscillations with high contact velocity, coexistence of stable oscillatory motions, and destructive, nonrepeatable, and unreliable characterization of the nanostructure. In this paper, dynamical systems tools for piecewise smooth systems are employed to characterize the loss of stability and associated parameter hysteresis phenomena.

Original languageEnglish (US)
Title of host publicationProc. of the ASME Int. Des. Eng. Tech. Conf. and Comput. and Information in Engineering Conferences - DETC2005
Subtitle of host publication5th International Conference on Multibody Systems, Nonlinear Dynamics, and Control
PublisherAmerican Society of Mechanical Engineers
Pages2011-2020
Number of pages10
ISBN (Print)0791847438, 9780791847435
DOIs
StatePublished - 2005
Externally publishedYes
EventDETC2005: ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Long Beach, CA, United States
Duration: Sep 24 2005Sep 28 2005

Publication series

NameProceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - DETC2005
Volume6 C

Other

OtherDETC2005: ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
CountryUnited States
CityLong Beach, CA
Period9/24/059/28/05

ASJC Scopus subject areas

  • Engineering(all)

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