Characteristics of optically controlled dielectric resonators with light injection hole

Ao Sheng Rong, Zhong Liang Sun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Optically controlled dielectric resonators have been proposed as basic blocks for the indirect optical control of microwave devices and circuits. However, its characterization still seems to be preliminary. The open structure has been analyzed by the perturbation method and the approximate method, but they neglected many important physical effects. On the other hand, the closed configuration has been accurately analyzed by these authors through a smart application of the equivalent principle. But the previous model assumed a homogeneous layer excitation and neglected the effect of the light injection hole. This paper presents an enhanced model for characterizing the optically controlled dielectric resonators.

Original languageEnglish (US)
Title of host publicationAP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)
Editors Anon
PublisherPubl by IEEE
Pages1512-1515
Number of pages4
ISBN (Print)0780312465
StatePublished - Dec 1 1993
Externally publishedYes
EventProceedings of the IEEE 1993 International Symposium Digest of Antennas and Propagation - Ann Arbor, MI, USA
Duration: Jun 28 1993Jul 2 1993

Publication series

NameAP-S International Symposium (Digest) (IEEE Antennas and Propagation Society)
Volume3
ISSN (Print)0272-4693

Other

OtherProceedings of the IEEE 1993 International Symposium Digest of Antennas and Propagation
CityAnn Arbor, MI, USA
Period6/28/937/2/93

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Rong, A. S., & Sun, Z. L. (1993). Characteristics of optically controlled dielectric resonators with light injection hole. In Anon (Ed.), AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society) (pp. 1512-1515). (AP-S International Symposium (Digest) (IEEE Antennas and Propagation Society); Vol. 3). Publ by IEEE.