Abstract
The electrical characteristics of Pd Schottky barrier to n-type GaN grown by MOCVD were investigated. The effective barrier height was found to be 0.94 and 1.07eV from I-V and C-V measurements, respectively. The ideality factor was approx.1.04. The effective Richardson constant was determined to be approx.3.24Acm-2K-2 using the modified Norde plot. These values were also compared to Au Schottky contacts.
Original language | English (US) |
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Pages (from-to) | 68-70 |
Number of pages | 3 |
Journal | Electronics Letters |
Volume | 32 |
Issue number | 1 |
DOIs | |
State | Published - Jan 4 1996 |
Externally published | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering