Challenges associated with in-situ TEM in environmental systems: The case of silver in aqueous solutions

Kyong Wook Noh, Yin Liu, Li Sun, Shen J. Dillon

Research output: Contribution to journalArticlepeer-review

Abstract

This work characterizes the effects of an electron beam on inducing microstructural evolution in Ag during environmental transmission electron microscopy. Two different processes, dissolution of Ag and deposition of Ag under the beam, were observed under different experimental conditions. The former primarily results from ionization induced by the primary beam and the latter primarily results from reduction of Ag + ions in solution by secondary electrons generated in the substrate. The relative rates vary with the activity of silver in solution and beam current density. A simple model based on chemical kinetics describes the general response of the system as a function of beam current density and solution composition.

Original languageEnglish (US)
Pages (from-to)34-38
Number of pages5
JournalUltramicroscopy
Volume116
DOIs
StatePublished - May 2012

Keywords

  • Electron beam effects
  • In-situ
  • TEM

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

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