CDM-reliable T-coil techniques for high-speed wireline receivers

Min Sun Keel, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An inherent CDM hazard exists in T-coil circuits due to magnetic coupling. An "inductance halving" technique is proposed to reduce magnetic coupling during ESD. From simulation, the proposed solution can effectively suppress voltage overshoot and minimize bandwidth degradation, compared to the conventional secondary ESD protection.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015
PublisherESD Association
ISBN (Electronic)1585372722, 9781585372737
StatePublished - Oct 30 2015
Event37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015 - Reno, United States
Duration: Sep 27 2015Oct 2 2015

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2015-October
ISSN (Print)0739-5159

Other

Other37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015
CountryUnited States
CityReno
Period9/27/1510/2/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Keel, M. S., & Rosenbaum, E. (2015). CDM-reliable T-coil techniques for high-speed wireline receivers. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2015-October). ESD Association.