Case study of DPI robustness of a MOS-SCR structure for automotive applications

Yang Xiu, Farzan Farbiz, Akram Salman, Yue Zu, Mariano Dissegna, Gianluca Boselli, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a case study to demonstrate that transient-triggered ESD protection circuits may fail the DPI automotive requirement. A novel scheme is devised to improve the DPI performance of a MOSSCR protection device while maintaining the system-level ESD performance.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016
PublisherESD Association
ISBN (Electronic)9781585372898
DOIs
StatePublished - Oct 14 2016
Event38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016 - Garden Grove (Anaheim), United States
Duration: Sep 11 2016Sep 16 2016

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2016-October
ISSN (Print)0739-5159

Other

Other38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016
CountryUnited States
CityGarden Grove (Anaheim)
Period9/11/169/16/16

Fingerprint

Thyristors
Networks (circuits)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Xiu, Y., Farbiz, F., Salman, A., Zu, Y., Dissegna, M., Boselli, G., & Rosenbaum, E. (2016). Case study of DPI robustness of a MOS-SCR structure for automotive applications. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016 [7592538] (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2016-October). ESD Association. https://doi.org/10.1109/EOSESD.2016.7592538

Case study of DPI robustness of a MOS-SCR structure for automotive applications. / Xiu, Yang; Farbiz, Farzan; Salman, Akram; Zu, Yue; Dissegna, Mariano; Boselli, Gianluca; Rosenbaum, Elyse.

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 2016. 7592538 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2016-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Xiu, Y, Farbiz, F, Salman, A, Zu, Y, Dissegna, M, Boselli, G & Rosenbaum, E 2016, Case study of DPI robustness of a MOS-SCR structure for automotive applications. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016., 7592538, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, vol. 2016-October, ESD Association, 38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016, Garden Grove (Anaheim), United States, 9/11/16. https://doi.org/10.1109/EOSESD.2016.7592538
Xiu Y, Farbiz F, Salman A, Zu Y, Dissegna M, Boselli G et al. Case study of DPI robustness of a MOS-SCR structure for automotive applications. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association. 2016. 7592538. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings). https://doi.org/10.1109/EOSESD.2016.7592538
Xiu, Yang ; Farbiz, Farzan ; Salman, Akram ; Zu, Yue ; Dissegna, Mariano ; Boselli, Gianluca ; Rosenbaum, Elyse. / Case study of DPI robustness of a MOS-SCR structure for automotive applications. Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016. ESD Association, 2016. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).
@inproceedings{8eb684af440d4bdcba5a0e1282408e86,
title = "Case study of DPI robustness of a MOS-SCR structure for automotive applications",
abstract = "This paper presents a case study to demonstrate that transient-triggered ESD protection circuits may fail the DPI automotive requirement. A novel scheme is devised to improve the DPI performance of a MOSSCR protection device while maintaining the system-level ESD performance.",
author = "Yang Xiu and Farzan Farbiz and Akram Salman and Yue Zu and Mariano Dissegna and Gianluca Boselli and Elyse Rosenbaum",
year = "2016",
month = "10",
day = "14",
doi = "10.1109/EOSESD.2016.7592538",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016",

}

TY - GEN

T1 - Case study of DPI robustness of a MOS-SCR structure for automotive applications

AU - Xiu, Yang

AU - Farbiz, Farzan

AU - Salman, Akram

AU - Zu, Yue

AU - Dissegna, Mariano

AU - Boselli, Gianluca

AU - Rosenbaum, Elyse

PY - 2016/10/14

Y1 - 2016/10/14

N2 - This paper presents a case study to demonstrate that transient-triggered ESD protection circuits may fail the DPI automotive requirement. A novel scheme is devised to improve the DPI performance of a MOSSCR protection device while maintaining the system-level ESD performance.

AB - This paper presents a case study to demonstrate that transient-triggered ESD protection circuits may fail the DPI automotive requirement. A novel scheme is devised to improve the DPI performance of a MOSSCR protection device while maintaining the system-level ESD performance.

UR - http://www.scopus.com/inward/record.url?scp=85008881210&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85008881210&partnerID=8YFLogxK

U2 - 10.1109/EOSESD.2016.7592538

DO - 10.1109/EOSESD.2016.7592538

M3 - Conference contribution

AN - SCOPUS:85008881210

T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016

PB - ESD Association

ER -