Case study of DPI robustness of a MOS-SCR structure for automotive applications

Yang Xiu, Farzan Farbiz, Akram Salman, Yue Zu, Mariano Dissegna, Gianluca Boselli, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a case study to demonstrate that transient-triggered ESD protection circuits may fail the DPI automotive requirement. A novel scheme is devised to improve the DPI performance of a MOSSCR protection device while maintaining the system-level ESD performance.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016
PublisherESD Association
ISBN (Electronic)9781585372898
DOIs
StatePublished - Oct 14 2016
Event38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016 - Garden Grove (Anaheim), United States
Duration: Sep 11 2016Sep 16 2016

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2016-October
ISSN (Print)0739-5159

Other

Other38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016
Country/TerritoryUnited States
CityGarden Grove (Anaheim)
Period9/11/169/16/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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