@article{cf591109b8644eeeb195ddf80ff08a65,
title = "Carrier profiling via scanning tunneling spectroscopy: Comparison with scanning capacitance microscopy",
author = "Liu, {F. Y.} and Griffin, {P. B.} and Plummer, {J. D.} and Lyding, {J. W.} and Moran, {J. M.} and Richards, {J. F.} and L. Kulig",
year = "2004",
doi = "10.1116/1.1643054",
language = "English (US)",
volume = "22",
pages = "422--426",
journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",
issn = "1071-1023",
publisher = "AVS Science and Technology Society",
number = "1",
}