Carbon nanotube transistors scaled to a 40-nanometer footprint

Qing Cao, Jerry Tersoff, Damon B. Farmer, Yu Zhu, Shu Jen Han

Research output: Contribution to journalArticlepeer-review

Abstract

The International Technology Roadmap for Semiconductors challenges the device research community to reduce the transistor footprint containing all components to 40 nanometers within the next decade. We report on a p-channel transistor scaled to such an extremely small dimension. Built on one semiconducting carbon nanotube, it occupies less than half the space of leading silicon technologies, while delivering a significantly higher pitch-normalized current density - above 0.9 milliampere per micrometer at a low supply voltage of 0.5 volts with a subthreshold swing of 85 millivolts per decade. Furthermore, we show transistors with the same small footprint built on actual high-density arrays of such nanotubes that deliver higher current than that of the best-competing silicon devices under the same overdrive, without any normalization. We achieve this using low-resistance end-bonded contacts, a high-purity semiconducting carbon nanotube source, and self-assembly to pack nanotubes into full surface-coverage aligned arrays.

Original languageEnglish (US)
Pages (from-to)1369-1372
Number of pages4
JournalScience
Volume356
Issue number6345
DOIs
StatePublished - Jun 30 2017
Externally publishedYes

ASJC Scopus subject areas

  • General

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