Cantilever for atomic force microscopy

Lawrence A Bergman (Inventor), Seok Kim (Inventor), Alexander Fotios Vakakis (Inventor), Han Na Cho (Inventor), Sajith Dhamasena (Inventor)

Research output: Patent


A cantilever system for use in an atomic force microscope (AFM) is disclosed. The cantilever system comprises a base cantilever portion and a paddle connected to the base cantilever portion with one end free to move relative to the base cantilever portion. The base cantilever portion has an effective bending stiffness, k1, and the paddle has an effective bending stiffness, k2. The ratio of the effective bending stiffness, k1, to the bending stiffness, k2, is at least greater than 4. Such a cantilever system provides a stable, i.e., invariant contact resonant frequency, independent of the changes in the local contact stiffness.
Original languageEnglish (US)
U.S. patent number10656175
StatePublished - May 19 2020


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