Cantilever dynamics and energy localization during atomic force microscope infrared spectroscopy

H. Cho, J. R. Felts, M. F. Yu, L. A. Bergman, A. F. Vakakis, W. P. King

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report rapid nanometer-scale chemical identification of polymer films using atomic force microscope infrared spectroscopy (AFM-IR). AFM-IR enables chemical characterization and identification in an AFM, but requires a relatively long acquisition time for high resolution mapping due to its low signal to noise ratio (SNR). In AFM-IR, infrared laser light incident upon a sample results in photothermal expansion of the sample, which is measured by an AFM tip in contact with the sample. The resulting cantilever vibrations vary in both time and frequency. We analyze the cantilever dynamic response during AFM-IR using a wavelet transform technique, which reveals how the energy is localized in the cantilever response. Based on this analysis, we tailor a time-frequency-domain filter to identify the region of highest vibrational energy. This approach can increase the SNR of the AFM-IR signal, such that the throughput is increased by 32X compared to state of the art. We show how this SNR improvement can improve AFM-IR imaging speed and chemical identification of nanometer-scale domains in polymer films.

Original languageEnglish (US)
Title of host publication2013 Transducers and Eurosensors XXVII
Subtitle of host publicationThe 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013
Pages908-911
Number of pages4
DOIs
StatePublished - Dec 1 2013
Event2013 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013 - Barcelona, Spain
Duration: Jun 16 2013Jun 20 2013

Publication series

Name2013 Transducers and Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013

Other

Other2013 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013
CountrySpain
CityBarcelona
Period6/16/136/20/13

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Keywords

  • Atomic force microscope infrared spectroscopy
  • cantilever dynamics
  • wavelet transform

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Cho, H., Felts, J. R., Yu, M. F., Bergman, L. A., Vakakis, A. F., & King, W. P. (2013). Cantilever dynamics and energy localization during atomic force microscope infrared spectroscopy. In 2013 Transducers and Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013 (pp. 908-911). [6626915] (2013 Transducers and Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS and EUROSENSORS 2013). https://doi.org/10.1109/Transducers.2013.6626915