Broadband mag-noise of patterned permalloy thin films

Hanqiao Zhang, Chaojiang Li, Ralu Divan, Axel Hoffmann, Pingshan Wang

Research output: Contribution to journalArticlepeer-review


A Y-factor noise figure (NF) measurement method is developed to characterize high-frequency mag-noise of a 550 nm wide Permalloy strip array under different dc bias currents. The noise voltage density is obtained. The proposed lumped element transmission line model describes noise properties of the patterned Py array well. Measurement data show that rapid ferromagnetic resonance frequencies (FMR) shift induced by dc bias current is related to the excess magnetization fluctuation thermally created by the combined dc current Joule heating effects and orthogonal Oersted fields.

Original languageEnglish (US)
Article number5467411
Pages (from-to)2442-2445
Number of pages4
JournalIEEE Transactions on Magnetics
Issue number6
StatePublished - Jun 2010
Externally publishedYes


  • Magnetic noise
  • Patterned permalloy thin films
  • Y-factor method

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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