Bravais lattice determination from a single CBED pattern

Research output: Contribution to journalConference articlepeer-review


Summarized in this paper is a new method of Bravais lattice determination using an arbitrary single convergent beam diffraction (CBED) pattern. The method uses the deficiency lines of high order and high order lane zone (HOLZ) reflections to measure the primitive cell of the zone axis, and use the standard Kirvy and Gruber procedure to reduce this arbitrary primitive cell to a unique Niggli cell, and thus the Bravais cell. The method requires only a single CBED pattern taken slightly off zone axis center in the so-called kinematic orientation and assumes that both camera length and high voltage are known with reasonable accuracy.

Original languageEnglish (US)
Pages (from-to)678-679
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - 1993
Externally publishedYes
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

ASJC Scopus subject areas

  • General Engineering


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