Blackbox macro-modeling of the nonlinearity based on Volterra series representation of X-parameters

Xiaoyan Y.Z. Xiong, Li J. Jiang, José E. Schutt-Ainé, Weng Cho Chew

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Volterra series representation is a powerful mathematical model for nonlinear devices. However, the difficulties in determining higher-order Volterra kernels limited its broader applications. This paper proposed a systematic approach that enables a convenient extraction of Volterra kernels from X-parameters for the first time. Then the Vandermonde method is employed to separate different orders of Volterra kernels at the same frequency, which leads to a highly efficient extraction process. The proposed Volterra series representation based on X-parameters is further benchmarked for verification. The proposed new algorithm is very useful for the blackbox macro-modeling of nonlinear devices and systems.

Original languageEnglish (US)
Title of host publication2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages85-88
Number of pages4
ISBN (Electronic)9781479936410
DOIs
StatePublished - Jan 1 2014
Event23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014 - Portland, United States
Duration: Oct 26 2014Oct 29 2014

Publication series

Name2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014

Other

Other23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014
CountryUnited States
CityPortland
Period10/26/1410/29/14

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Keywords

  • Volterra series
  • X-parameters
  • macro-modeling

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Xiong, X. Y. Z., Jiang, L. J., Schutt-Ainé, J. E., & Chew, W. C. (2014). Blackbox macro-modeling of the nonlinearity based on Volterra series representation of X-parameters. In 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014 (pp. 85-88). [7103601] (2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPEPS.2014.7103601