@inproceedings{dc90ab3b755e4107bb5eb5e354f3c310,
title = "Blackbox macro-modeling of the nonlinearity based on Volterra series representation of X-parameters",
abstract = "Volterra series representation is a powerful mathematical model for nonlinear devices. However, the difficulties in determining higher-order Volterra kernels limited its broader applications. This paper proposed a systematic approach that enables a convenient extraction of Volterra kernels from X-parameters for the first time. Then the Vandermonde method is employed to separate different orders of Volterra kernels at the same frequency, which leads to a highly efficient extraction process. The proposed Volterra series representation based on X-parameters is further benchmarked for verification. The proposed new algorithm is very useful for the blackbox macro-modeling of nonlinear devices and systems.",
keywords = "Volterra series, X-parameters, macro-modeling",
author = "Xiong, {Xiaoyan Y.Z.} and Jiang, {Li J.} and Schutt-Ain{\'e}, {Jos{\'e} E.} and Chew, {Weng Cho}",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 23rd IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014 ; Conference date: 26-10-2014 Through 29-10-2014",
year = "2014",
doi = "10.1109/EPEPS.2014.7103601",
language = "English (US)",
series = "2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "85--88",
booktitle = "2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014",
address = "United States",
}