@inproceedings{0e21d45355dc4f21b6d2dbbf8ee73d9f,
title = "Biaxially-Stretchable Kirigami-Patterned Mesh Structures for Motion Artifact-Free Wearable Devices",
abstract = "We report a kirigami patterned island-bridge mesh structure as a platform for motion artifact-free wearable sensors. Using finite element analysis (FEA) simulation, we demonstrate that 2\times 2,3\times 3, and 4\times 4 kirigami-patterned mesh structures can be stretched beyond 100% owing to the out-of-plane bending deformation of kirigami-patterned bridges. In addition, we show that local strain in the islands is predicted to be maintained below 0.1% under biaxial strain of 100% regardless of the mesh size.",
keywords = "Kirigami, Strain-insensitivity, Stretchable electronics",
author = "Lee, {Hyo Chan} and Hsieh, {Ezekiel Y.} and Nam, {Sung Woo}",
note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021 ; Conference date: 08-04-2021 Through 11-04-2021",
year = "2021",
month = apr,
day = "8",
doi = "10.1109/EDTM50988.2021.9420855",
language = "English (US)",
series = "2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021",
address = "United States",
}