Biaxial testing of nanoscale films on compliant substrates: Fatigue and fracture

B. Erdem Alaca, John C. Selby, M. T.A. Saif, Huseyin Sehitoglu

Research output: Contribution to journalArticle

Original languageEnglish (US)
Number of pages1
JournalReview of Scientific Instruments
Volume73
Issue number8
DOIs
StatePublished - Aug 1 2002

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Fatigue of materials
Testing
Substrates

ASJC Scopus subject areas

  • Instrumentation

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Biaxial testing of nanoscale films on compliant substrates : Fatigue and fracture. / Erdem Alaca, B.; Selby, John C.; Saif, M. T.A.; Sehitoglu, Huseyin.

In: Review of Scientific Instruments, Vol. 73, No. 8, 01.08.2002.

Research output: Contribution to journalArticle

@article{e56f4be611644cabab821ecfb17f9728,
title = "Biaxial testing of nanoscale films on compliant substrates: Fatigue and fracture",
author = "{Erdem Alaca}, B. and Selby, {John C.} and Saif, {M. T.A.} and Huseyin Sehitoglu",
year = "2002",
month = "8",
day = "1",
doi = "10.1063/1.1488685",
language = "English (US)",
volume = "73",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "8",

}

TY - JOUR

T1 - Biaxial testing of nanoscale films on compliant substrates

T2 - Fatigue and fracture

AU - Erdem Alaca, B.

AU - Selby, John C.

AU - Saif, M. T.A.

AU - Sehitoglu, Huseyin

PY - 2002/8/1

Y1 - 2002/8/1

UR - http://www.scopus.com/inward/record.url?scp=0036684908&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036684908&partnerID=8YFLogxK

U2 - 10.1063/1.1488685

DO - 10.1063/1.1488685

M3 - Article

AN - SCOPUS:0036684908

VL - 73

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 8

ER -