TY - JOUR
T1 - Better-than-worst-case design
T2 - Progress and opportunities
AU - Cong, Jason
AU - Duwe, Henry
AU - Kumar, Rakesh
AU - Li, Sen
N1 - Funding Information:
Survey The research is partially supported by the National Science Foundation of USA under Grant No. CCF-0903541. ©2014 Springer Science + Business Media, LLC & Science Press, China
PY - 2014/1
Y1 - 2014/1
N2 - Today, designers are forced to reduce performance and increase power requirements in order to reserve larger margins that are required due to the greater variability introduced by smaller feature sizes and manufacturing variations of modern IC designs. The better-than-worst-case design can both address the variability problem and achieve higher performance/energy efficiency than the worst-case design. This paper surveys the progress to date, provides a snapshot of the most representative methods in this field, and discusses the future research directions of the better-than-worst-case design.
AB - Today, designers are forced to reduce performance and increase power requirements in order to reserve larger margins that are required due to the greater variability introduced by smaller feature sizes and manufacturing variations of modern IC designs. The better-than-worst-case design can both address the variability problem and achieve higher performance/energy efficiency than the worst-case design. This paper surveys the progress to date, provides a snapshot of the most representative methods in this field, and discusses the future research directions of the better-than-worst-case design.
KW - better-than-worst-case
KW - error resilience
KW - variability
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U2 - 10.1007/s11390-014-1457-2
DO - 10.1007/s11390-014-1457-2
M3 - Article
AN - SCOPUS:84904422342
SN - 1000-9000
VL - 29
SP - 656
EP - 663
JO - Journal of Computer Science and Technology
JF - Journal of Computer Science and Technology
IS - 4
ER -