TY - GEN
T1 - Balancing the trade-off between performance and mis-trigger immunity in active feedback-based high-voltage tolerant power clamps
AU - Ayling, Alex
AU - Salcedo, Javier
AU - Parthasarathy, Srivatsan
AU - Hajjar, Jean Jacques
AU - Rosenbaum, Elyse
N1 - Publisher Copyright:
© 2020 ESD Association. All rights reserved.
PY - 2020/9/13
Y1 - 2020/9/13
N2 - - An optimally-biased active feedback-based high-voltage tolerant power clamp is designed to bypass the trade-off between ESD performance and mis-trigger immunity. The design is fabricated in 28-nm CMOS, and measurements show a 70% improvement in failure current over previous designs, in addition to a lower clamping voltage, while maintaining mis-trigger resiliency.
AB - - An optimally-biased active feedback-based high-voltage tolerant power clamp is designed to bypass the trade-off between ESD performance and mis-trigger immunity. The design is fabricated in 28-nm CMOS, and measurements show a 70% improvement in failure current over previous designs, in addition to a lower clamping voltage, while maintaining mis-trigger resiliency.
UR - http://www.scopus.com/inward/record.url?scp=85097147518&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85097147518&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:85097147518
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020
PB - ESD Association
T2 - 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2020
Y2 - 13 September 2020 through 18 September 2020
ER -