Balancing the trade-off between performance and mis-trigger immunity in active feedback-based high-voltage tolerant power clamps

Alex Ayling, Javier Salcedo, Srivatsan Parthasarathy, Jean Jacques Hajjar, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

- An optimally-biased active feedback-based high-voltage tolerant power clamp is designed to bypass the trade-off between ESD performance and mis-trigger immunity. The design is fabricated in 28-nm CMOS, and measurements show a 70% improvement in failure current over previous designs, in addition to a lower clamping voltage, while maintaining mis-trigger resiliency.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020
PublisherESD Association
ISBN (Electronic)9781728194615
StatePublished - Sep 13 2020
Event42nd Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2020 - Reno, United States
Duration: Sep 13 2020Sep 18 2020

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2020-September
ISSN (Print)0739-5159

Conference

Conference42nd Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2020
CountryUnited States
CityReno
Period9/13/209/18/20

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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