Abstract

Self-healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium-indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).

Original languageEnglish (US)
Pages (from-to)398-401
Number of pages4
JournalAdvanced Materials
Volume24
Issue number3
DOIs
StatePublished - Jan 17 2012

Keywords

  • electrical conductivity
  • microelectronics
  • self-healing materials
  • stimuli-responsive materials

ASJC Scopus subject areas

  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering

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