Automated derivation of application-aware error detectors using static analysis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a technique to derive and implement error detectors to protect an application from data errors. The error detectors are derived automatically using compiler-based static analysis from the backward program slice of critical variables in the program. Critical variables are defined as those that are highly sensitive to errors, and deriving error detectors for these variables provides high coverage for errors in any data value used in the program. The error detectors take the form of checking expressions and are optimized for each control flow path followed at runtime. The derived detectors are implemented using a combination of hardware and software. Experiments show that the derived detectors incur low performance overheads while achieving high detection coverage for errors that impact the application.

Original languageEnglish (US)
Title of host publicationProceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium
Pages211-216
Number of pages6
DOIs
StatePublished - Dec 1 2007
EventIOLTS 2007 13th IEEE International On-Line Testing Symposium - Heraklion, Crete, Greece
Duration: Jul 8 2007Jul 11 2007

Publication series

NameProceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium

Other

OtherIOLTS 2007 13th IEEE International On-Line Testing Symposium
CountryGreece
CityHeraklion, Crete
Period7/8/077/11/07

Keywords

  • Backward slicing
  • Checking expression
  • Compiler techniques
  • Critical variables
  • Path-tracking

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Pattabiraman, K., Kalbarczyk, Z., & Iyer, R. K. (2007). Automated derivation of application-aware error detectors using static analysis. In Proceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium (pp. 211-216). [4274853] (Proceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium). https://doi.org/10.1109/IOLTS.2007.21