Atomic-scale characterization of single-walled carbon nanotubes on Si(100)-2 × 1:H with the ultrahigh vacuum scanning tunneling microscope

P. M. Albrecht, J. W. Lyding

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Atomic-scale characterization of single-walled carbon nanotubes on Si(100)-2 × 1:H with the ultrahigh vacuum scanning tunneling microscope'. Together they form a unique fingerprint.

Keyphrases

Material Science