Atomic Resolution Tomography on Simulated Amorphous Silicon Nanoparticles

Robert Busch, Peter Rez, Michael M.J. Treacy, Jian Min Zuo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1390-1391
Number of pages2
JournalMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume29
Issue number1
DOIs
StatePublished - Jul 22 2023
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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