Atomic-resolution imaging of crystals using charge flipping and precession electron diffraction

Hefei Hu, J. M. Zuo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)740-741
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

ASJC Scopus subject areas

  • Instrumentation

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