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Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

  • J. G. Wen
  • , D. J. Miller
  • , N. J. Zaluzec
  • , J. M. Hiller
  • , R. E. Cook
  • , A. B. Shah
  • , Jian-Min Zuo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)384-385
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
StatePublished - Jul 2012

ASJC Scopus subject areas

  • Instrumentation

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