Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

J. G. Wen; D. J. Miller; N. J. Zaluzec; J. M. Hiller; R. E. Cook; A. B. Shah; Jian-Min Zuo

doi:10.1017/S1431927612003777

Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

J. G. Wen, D. J. Miller, N. J. Zaluzec, J. M. Hiller, R. E. Cook, A. B. Shah, Jian-Min Zuo

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	384-385
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612003777
State	Published - Jul 2012

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Instrumentation

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10.1017/S1431927612003777

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title = "Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM",

author = "Wen, {J. G.} and Miller, {D. J.} and Zaluzec, {N. J.} and Hiller, {J. M.} and Cook, {R. E.} and Shah, {A. B.} and Jian-Min Zuo",

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AU - Wen, J. G.

AU - Miller, D. J.

AU - Zaluzec, N. J.

AU - Hiller, J. M.

AU - Cook, R. E.

AU - Shah, A. B.

AU - Zuo, Jian-Min

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

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