Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

J. G. Wen, D. J. Miller, N. J. Zaluzec, J. M. Hiller, R. E. Cook, A. B. Shah, Jian-Min Zuo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)384-385
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS2
StatePublished - Jul 2012

ASJC Scopus subject areas

  • Instrumentation

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