| Original language | English (US) |
|---|---|
| Pages (from-to) | 576-577 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 12 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 2006 |
ASJC Scopus subject areas
- Instrumentation
Atomic resolution electron diffraction imaging of metallic nanoclusters
- W. J. Huang
- , B. Jiang
- , J. M. Zuo
Research output: Contribution to journal › Article › peer-review