Atomic imaging across strain boundaries in bilayer graphene with ADF-STEM and DF-TEM

Robert Hovden, Jonathan Alden, Adam W. Tsen, Pinshane Y. Huang, Lola Brown, Jiwoong Park, Paul L. McEuen, David A. Muller

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish (US)
Pages (from-to)1058-1059
Number of pages2
JournalMicroscopy and Microanalysis
Issue number3
StatePublished - Aug 1 2014
Externally publishedYes
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

ASJC Scopus subject areas

  • Instrumentation

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