Atomic imaging across strain boundaries in bilayer graphene with ADF-STEM and DF-TEM

Robert Hovden, Jonathan Alden, Adam W. Tsen, Pinshane Y. Huang, Lola Brown, Jiwoong Park, Paul L. McEuen, David A. Muller

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)1058-1059
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
Externally publishedYes
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

ASJC Scopus subject areas

  • Instrumentation

Cite this

Hovden, R., Alden, J., Tsen, A. W., Huang, P. Y., Brown, L., Park, J., McEuen, P. L., & Muller, D. A. (2014). Atomic imaging across strain boundaries in bilayer graphene with ADF-STEM and DF-TEM. Microscopy and Microanalysis, 20(3), 1058-1059. https://doi.org/10.1017/S1431927614007016