Atomic force microscope cantilevers for combined thermomechanical data writing and reading

William P. King; Thomas W. Kenny; Kenneth E. Goodson; Graham Cross; Michel Despont; Urs Dürig; Hugo Rothuizen; Gerd K. Binnig; Peter Vettiger

doi:10.1063/1.1351846

Atomic force microscope cantilevers for combined thermomechanical data writing and reading

William P. King, Thomas W. Kenny, Kenneth E. Goodson, Graham Cross, Michel Despont, Urs Dürig, Hugo Rothuizen, Gerd K. Binnig, Peter Vettiger

Research output: Contribution to journal › Article › peer-review

Abstract

Heat conduction governs the ultimate writing and reading capabilities of a thermomechanical data storage device. This work investigates transient heat conduction in a resistively heated atomic force microscope cantilever through measurement and simulation of cantilever thermal and electrical behavior. The time required to heat a single cantilever to bit-writing temperature is near 1 μs and the thermal data reading sensitivity ΔR/R is near 1 × 10^-4 per vertical nm. Finite-difference thermal and electrical simulation results compare well with electrical measurements during writing and reading, indicating design tradeoffs in power requirements, data writing speed, and data reading sensitivity. We present a design for a proposed cantilever that is predicted to be faster and more sensitive than the present cantilever.

Original language	English (US)
Pages (from-to)	1300-1302
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	9
DOIs	https://doi.org/10.1063/1.1351846
State	Published - Feb 26 2001
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1351846

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abstract = "Heat conduction governs the ultimate writing and reading capabilities of a thermomechanical data storage device. This work investigates transient heat conduction in a resistively heated atomic force microscope cantilever through measurement and simulation of cantilever thermal and electrical behavior. The time required to heat a single cantilever to bit-writing temperature is near 1 μs and the thermal data reading sensitivity ΔR/R is near 1 × 10-4 per vertical nm. Finite-difference thermal and electrical simulation results compare well with electrical measurements during writing and reading, indicating design tradeoffs in power requirements, data writing speed, and data reading sensitivity. We present a design for a proposed cantilever that is predicted to be faster and more sensitive than the present cantilever.",

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AU - King, William P.

AU - Kenny, Thomas W.

AU - Goodson, Kenneth E.

AU - Cross, Graham

AU - Despont, Michel

AU - Dürig, Urs

AU - Rothuizen, Hugo

AU - Binnig, Gerd K.

AU - Vettiger, Peter

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Atomic force microscope cantilevers for combined thermomechanical data writing and reading

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