Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Jean Paul Morniroli; Patrick Cordier; Éric Van Cappellen; Jin Min Zuo; John Spence

doi:10.1051/mmm:1997114

Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Jean Paul Morniroli, Patrick Cordier, Éric Van Cappellen, Jin Min Zuo, John Spence

Research output: Contribution to journal › Article › peer-review

Abstract

It is shown how the technique of Convergent Beam IMaging (CBIM), proposed by Humpreys et al. in 1988, can be useful for the analysis of crystal defects such as dislocations in Garnet. It is also shown how the original technique can be greatly improved by using an objective aperture, a very small spot size and an energy filter. With these experimental conditions, the quality of the CBIM patterns is nearly as good as the quality of LACBED patterns, with which they are compared.

Original language	English (US)
Pages (from-to)	187-202
Number of pages	16
Journal	Microscopy Microanalysis Microstructures
Volume	8
Issue number	3
DOIs	https://doi.org/10.1051/mmm:1997114
State	Published - 1997
Externally published	Yes

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Instrumentation

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10.1051/mmm:1997114

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abstract = "It is shown how the technique of Convergent Beam IMaging (CBIM), proposed by Humpreys et al. in 1988, can be useful for the analysis of crystal defects such as dislocations in Garnet. It is also shown how the original technique can be greatly improved by using an objective aperture, a very small spot size and an energy filter. With these experimental conditions, the quality of the CBIM patterns is nearly as good as the quality of LACBED patterns, with which they are compared.",

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AU - Morniroli, Jean Paul

AU - Cordier, Patrick

AU - Van Cappellen, Éric

AU - Zuo, Jin Min

AU - Spence, John

PY - 1997

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AB - It is shown how the technique of Convergent Beam IMaging (CBIM), proposed by Humpreys et al. in 1988, can be useful for the analysis of crystal defects such as dislocations in Garnet. It is also shown how the original technique can be greatly improved by using an objective aperture, a very small spot size and an energy filter. With these experimental conditions, the quality of the CBIM patterns is nearly as good as the quality of LACBED patterns, with which they are compared.

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Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Abstract

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