Abstract
This paper provides an overview of advanced scanning transmission electron microscopy (STEM) techniques used for characterization of irradiated BCC Fe-based alloys. Advanced STEM methods provide the high-resolution imaging and chemical analysis necessary to understand the irradiation response of BCC Fe-based alloys. The use of STEM with energy dispersive x-ray spectroscopy (EDX) for measurement of radiation-induced segregation (RIS) is described, with an illustrated example of RIS in proton- and self-ion irradiated T91. Aberration-corrected STEM-EDX for nanocluster/nanoparticle imaging and chemical analysis is also discussed, and examples are provided from ion-irradiated oxide dispersion strengthened (ODS) alloys. Finally, STEM techniques for void, cavity, and dislocation loop imaging are described, with examples from various BCC Fe-based alloys.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1275-1289 |
| Number of pages | 15 |
| Journal | Journal of Materials Research |
| Volume | 30 |
| Issue number | 9 |
| DOIs | |
| State | Published - Jan 27 2015 |
| Externally published | Yes |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering