Application of Saluja-Karpovsky compactors to test responses with many unknowns

J. H. Patel, S. S. Lumetta, S. M. Reddy

Research output: Chapter in Book/Report/Conference proceedingConference contribution


This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detection and correction codes. The technique, called i-Compact, uses Saluja-Karpovsky Space Compactors, but permits detection and location of errors in the presence of unknown logic (X) values with help from the ATE. The advantages of i-Compact are: 1. Small number of output pins front the compactors for a required error detection capability; 2. Small tester memory for storing expected responses; 3. Flexibility of choosing several different combinations of number of X values and number of bit errors for error detection without altering the hardware compactor; 4. Same hardware capable of identifying the line that produced an error in presence of unknowns; 5. Use of non-proprietary codes found in the literature of 1950s; and 6. Independent of the circuit and the test generator.

Original languageEnglish (US)
Title of host publicationProceedings - 21st IEEE VLSI Test Symposium, VTS 2003
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)0769519245
StatePublished - 2003
Event21st IEEE VLSI Test Symposium, VTS 2003 - Napa Valley, United States
Duration: Apr 27 2003May 1 2003

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Other21st IEEE VLSI Test Symposium, VTS 2003
Country/TerritoryUnited States
CityNapa Valley


  • Circuit testing
  • Cities and towns
  • Compaction
  • Design for testability
  • Engineering profession
  • Error correction codes
  • Hardware
  • Logic testing
  • Pins
  • Shift registers

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering


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