Application of Saluja-Karpovsky compactors to test responses with many unknowns

J. H. Patel, Steven Sam Lumetta, S. M. Reddy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detection and correction codes. The technique, called i-Compact, uses Saluja-Karpovsky Space Compactors, but permits detection and location of errors in the presence of unknown logic (X) values with help from the ATE. The advantages of i-Compact are: 1. Small number of output pins front the compactors for a required error detection capability; 2. Small tester memory for storing expected responses; 3. Flexibility of choosing several different combinations of number of X values and number of bit errors for error detection without altering the hardware compactor; 4. Same hardware capable of identifying the line that produced an error in presence of unknowns; 5. Use of non-proprietary codes found in the literature of 1950s; and 6. Independent of the circuit and the test generator.

Original languageEnglish (US)
Title of host publicationProceedings - 21st IEEE VLSI Test Symposium, VTS 2003
PublisherIEEE Computer Society
Pages107-112
Number of pages6
ISBN (Electronic)0769519245
DOIs
StatePublished - Jan 1 2003
Event21st IEEE VLSI Test Symposium, VTS 2003 - Napa Valley, United States
Duration: Apr 27 2003May 1 2003

Publication series

NameProceedings of the IEEE VLSI Test Symposium
Volume2003-January

Other

Other21st IEEE VLSI Test Symposium, VTS 2003
CountryUnited States
CityNapa Valley
Period4/27/035/1/03

Keywords

  • Circuit testing
  • Cities and towns
  • Compaction
  • Design for testability
  • Engineering profession
  • Error correction codes
  • Hardware
  • Logic testing
  • Pins
  • Shift registers

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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  • Cite this

    Patel, J. H., Lumetta, S. S., & Reddy, S. M. (2003). Application of Saluja-Karpovsky compactors to test responses with many unknowns. In Proceedings - 21st IEEE VLSI Test Symposium, VTS 2003 (pp. 107-112). [1197640] (Proceedings of the IEEE VLSI Test Symposium; Vol. 2003-January). IEEE Computer Society. https://doi.org/10.1109/VTEST.2003.1197640