@inproceedings{78eb687392824d4b83620a25dda11ccd,
title = "Application of Saluja-Karpovsky compactors to test responses with many unknowns",
abstract = "This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detection and correction codes. The technique, called i-Compact, uses Saluja-Karpovsky Space Compactors, but permits detection and location of errors in the presence of unknown logic (X) values with help from the ATE. The advantages of i-Compact are: 1. Small number of output pins front the compactors for a required error detection capability; 2. Small tester memory for storing expected responses; 3. Flexibility of choosing several different combinations of number of X values and number of bit errors for error detection without altering the hardware compactor; 4. Same hardware capable of identifying the line that produced an error in presence of unknowns; 5. Use of non-proprietary codes found in the literature of 1950s; and 6. Independent of the circuit and the test generator.",
keywords = "Circuit testing, Cities and towns, Compaction, Design for testability, Engineering profession, Error correction codes, Hardware, Logic testing, Pins, Shift registers",
author = "Patel, {J. H.} and Lumetta, {Steven Sam} and Reddy, {S. M.}",
year = "2003",
month = jan,
day = "1",
doi = "10.1109/VTEST.2003.1197640",
language = "English (US)",
series = "Proceedings of the IEEE VLSI Test Symposium",
publisher = "IEEE Computer Society",
pages = "107--112",
booktitle = "Proceedings - 21st IEEE VLSI Test Symposium, VTS 2003",
note = "21st IEEE VLSI Test Symposium, VTS 2003 ; Conference date: 27-04-2003 Through 01-05-2003",
}