Application of an advanced maximum likelihood estimation restoration method for enhanced-resolution and contrast in second-harmonic generation microscopy

Mayandi Sivaguru, Mohammad M. Kabir, Manas Ranjan Gartia, David S.C. Biggs, Barghav S. Sivaguru, Vignesh A. Sivaguru, Glenn A. Fried, Gang Logan Liu, Sakthivel Sadayappan, Kimani C. Toussaint

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