Application of advanced microstructural and microchemical microscopy techniques to chalcopyrite solar cells

Changhui Lei, Chun Ming Li, Angus Rockett, I. M. Robertson, W. Shafarman

Research output: Contribution to journalConference article

Abstract

Analytical TEM techniques have been used to characterize the structure and chemistry of chalcopyrite solar cell devices produced by elemental evaporation using a bi-layer process at T s=400°C and T s=550°C. Dislocations, stacking faults, twins and voids exist in both materials but at a reduced density at the higher deposition temperature. The higher processing temperature also improved the density and structure of the grain boundaries and created a less rough surface. The CdS layer coats the surface conformally, although the roughness impacts the structure. CdS fills the grooves in the surface and infiltrates lower density grain boundaries to significant depths. The chemistry of the grain boundaries does not appear to be significantly impacted by the presence of the Cd and S.

Original languageEnglish (US)
Article numberF4.3
Pages (from-to)93-103
Number of pages11
JournalMaterials Research Society Symposium Proceedings
Volume865
StatePublished - Dec 1 2005
Event2005 Materials Research Society Spring Meeting - San Francisco, CA, United States
Duration: Mar 28 2005Apr 1 2005

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ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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