@inproceedings{659217e05ecd4aa6888c53534d88adfa,
title = "Application level investigation of system-level ESD-induced soft failures",
abstract = "Hardware and application level manifestations of ESD soft failures were characterized for a singleboard computer and similar products. Failures associated with the peripheral ICs occur independent of the application being run; the application-dependent failures are attributed to noise at the CPU.",
author = "Sandeep Vora and Rui Jiang and Shobha Vasudevan and Elyse Rosenbaum",
note = "Publisher Copyright: {\textcopyright} 2016 EOS/ESD Association.; 38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016 ; Conference date: 11-09-2016 Through 16-09-2016",
year = "2016",
month = oct,
day = "14",
doi = "10.1109/EOSESD.2016.7592565",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016",
}