Application level investigation of system-level ESD-induced soft failures

Sandeep Vora, Rui Jiang, Shobha Vasudevan, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Hardware and application level manifestations of ESD soft failures were characterized for a singleboard computer and similar products. Failures associated with the peripheral ICs occur independent of the application being run; the application-dependent failures are attributed to noise at the CPU.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016
PublisherESD Association
ISBN (Electronic)9781585372898
DOIs
StatePublished - Oct 14 2016
Event38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016 - Garden Grove (Anaheim), United States
Duration: Sep 11 2016Sep 16 2016

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2016-October
ISSN (Print)0739-5159

Other

Other38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016
CountryUnited States
CityGarden Grove (Anaheim)
Period9/11/169/16/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Vora, S., Jiang, R., Vasudevan, S., & Rosenbaum, E. (2016). Application level investigation of system-level ESD-induced soft failures. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016 [7592565] (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2016-October). ESD Association. https://doi.org/10.1109/EOSESD.2016.7592565