@inproceedings{659217e05ecd4aa6888c53534d88adfa,
title = "Application level investigation of system-level ESD-induced soft failures",
abstract = "Hardware and application level manifestations of ESD soft failures were characterized for a singleboard computer and similar products. Failures associated with the peripheral ICs occur independent of the application being run; the application-dependent failures are attributed to noise at the CPU.",
author = "Sandeep Vora and Rui Jiang and Shobha Vasudevan and Elyse Rosenbaum",
note = "Funding Information: This material is based upon work supported by the National Science Foundation under Grant No. 1526106. The authors would like to thank Dr. J. Patel of UIUC for useful discussions. Publisher Copyright: {\textcopyright} 2016 EOS/ESD Association.; 38th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2016 ; Conference date: 11-09-2016 Through 16-09-2016",
year = "2016",
month = oct,
day = "14",
doi = "10.1109/EOSESD.2016.7592565",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2016, EOS/ESD 2016",
}