Application-level fault tolerance in the orbital thermal imaging spectrometer

E. Ciocca, I. Koren, Z. Koren, C. M. Krishna, D. S. Katz

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fingerprint

Dive into the research topics of 'Application-level fault tolerance in the orbital thermal imaging spectrometer'. Together they form a unique fingerprint.

Keyphrases

Engineering

Computer Science