Application-level fault tolerance in the orbital thermal imaging spectrometer

E. Ciocca; I. Koren; Z. Koren; C. M. Krishna; D. S. Katz

doi:10.1109/PRDC.2004.1276551

Application-level fault tolerance in the orbital thermal imaging spectrometer

E. Ciocca, I. Koren, Z. Koren, C. M. Krishna, D. S. Katz

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Systems that operate in extremely volatile environments, such as orbiting satellites, must be designed with a strong emphasis on fault tolerance. Rather than rely solely on the system hardware, it may be beneficial to entrust some of the fault handling to software at the application level, which can utilize semantic information and software communication channels to achieve fault tolerance with considerably less power and performance overhead. This paper details the implementation and evaluation of such a software-level approach, Application-Level Fault Tolerance and Detection (ALFTD) into the Orbital Thermal Imaging Spectrometer (OTIS).

Original language	English (US)
Title of host publication	Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing
Pages	43-48
Number of pages	6
DOIs	https://doi.org/10.1109/PRDC.2004.1276551
State	Published - Jun 15 2004
Externally published	Yes
Event	Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing - Papeete Tahiti, French Polynesia Duration: Mar 3 2004 → Mar 5 2004

Publication series

Name	Proceedings - IEEE Pacific Rim International Symposium on Dependable Computing

Other

Other	Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing
Country/Territory	French Polynesia
City	Papeete Tahiti
Period	3/3/04 → 3/5/04

ASJC Scopus subject areas

Engineering(all)

Online availability

10.1109/PRDC.2004.1276551

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Ciocca, E., Koren, I., Koren, Z., Krishna, C. M., & Katz, D. S. (2004). Application-level fault tolerance in the orbital thermal imaging spectrometer. In Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing (pp. 43-48). (Proceedings - IEEE Pacific Rim International Symposium on Dependable Computing). https://doi.org/10.1109/PRDC.2004.1276551

Application-level fault tolerance in the orbital thermal imaging spectrometer. / Ciocca, E.; Koren, I.; Koren, Z. et al.
Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing. 2004. p. 43-48 (Proceedings - IEEE Pacific Rim International Symposium on Dependable Computing).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ciocca, E, Koren, I, Koren, Z, Krishna, CM & Katz, DS 2004, Application-level fault tolerance in the orbital thermal imaging spectrometer. in Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing. Proceedings - IEEE Pacific Rim International Symposium on Dependable Computing, pp. 43-48, Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing, Papeete Tahiti, French Polynesia, 3/3/04. https://doi.org/10.1109/PRDC.2004.1276551

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Application-level fault tolerance in the orbital thermal imaging spectrometer

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