Apparatus and method for in situ testing of microscale and nanoscale samples

Engineering

• Microscale 100%
• Nanoscale 100%
• In-Situ Testing 100%
• Melting Temperature 50%
• Open Circuit 50%
• Conductive Material 50%
• Sensor Beam 50%
• Conductive Path 50%
• Melting Point 50%

Keyphrases

• Free End 100%
• In-situ Test 100%
• Longitudinal Beam 66%
• Force Sensor 33%
• Deformable 33%
• Support Structure 33%
• Open Circuit 33%
• Conductive Materials 33%
• High Melting Temperature 33%
• Conductive Path 33%
• Side Beam 33%
• Microscale Testing 33%