Anomalous suppression of the Bose glass at commensurate fillings in the disordered Bose-Hubbard model

Frank Krüger, Jiansheng Wu, Philip Phillips

Research output: Contribution to journalArticle

Abstract

We study the weakly disordered Bose-Hubbard model on a cubic lattice through a one-loop renormalization-group analysis of the corresponding effective-field theory which is explicitly derived by combining a strong-coupling expansion with a replica average over the disorder. The method is applied not only to generic uncorrelated on-site disorder but also to simultaneous hopping-disorder correlated with the differences of adjacent disorder potentials. Such correlations are inherent in fine-grained optical speckle potentials used as a source of disorder in optical lattice experiments. As a result of strong coupling, the strength of the replica-mixing disorder vertex, responsible for the emergence of a Bose glass, crucially depends on the chemical potential and the Hubbard repulsion and vanishes to leading order in the disorder at commensurate boson fillings. As a consequence, at such fillings a direct transition between the Mott insulator and the superfluid in the presence of disorder cannot be excluded on the basis of a one-loop calculation. At incommensurate fillings, at a certain length scale, the Mott insulator will eventually become unstable toward the formation of a Bose glass. Phase diagrams as a function of the microscopic parameters are presented and the finite-size crossover between the Mott-insulating state and the Bose glass is analyzed.

Original languageEnglish (US)
Article number094526
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume80
Issue number9
DOIs
StatePublished - Sep 25 2009

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Anomalous suppression of the Bose glass at commensurate fillings in the disordered Bose-Hubbard model'. Together they form a unique fingerprint.

  • Cite this