Annealing-dependent magnetic depth profile in Ga1-xMnx As

B. J. Kirby, J. A. Borchers, J. J. Rhyne, S. G.E. Te Velthuis, A. Hoffmann, K. V. O’donovan, T. Wojtowicz, X. Liu, W. L. Lim, J. K. Furdyna

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