Annealing-dependent magnetic depth profile in Ga1-xMnx As

B. J. Kirby, J. A. Borchers, J. J. Rhyne, S. G.E. Te Velthuis, A. Hoffmann, K. V. O’donovan, T. Wojtowicz, X. Liu, W. L. Lim, J. K. Furdyna

Research output: Contribution to journalArticlepeer-review

Abstract

We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga1-xMnx As films using polarized neutron reflectometry. In addition to increasing the total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.

Original languageEnglish (US)
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume69
Issue number8
DOIs
StatePublished - 2004
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Annealing-dependent magnetic depth profile in Ga<sub>1-x</sub>Mn<sub>x</sub> As'. Together they form a unique fingerprint.

Cite this