Annealing-dependent magnetic depth profile in Ga1-xMnx As

B. J. Kirby; J. A. Borchers; J. J. Rhyne; S. G.E. Te Velthuis; A. Hoffmann; K. V. O’donovan; T. Wojtowicz; X. Liu; W. L. Lim; J. K. Furdyna

doi:10.1103/PhysRevB.69.081307

Annealing-dependent magnetic depth profile in Ga_1-xMn_x As

B. J. Kirby, J. A. Borchers, J. J. Rhyne, S. G.E. Te Velthuis, A. Hoffmann, K. V. O’donovan, T. Wojtowicz, X. Liu, W. L. Lim, J. K. Furdyna

Research output: Contribution to journal › Article › peer-review

Abstract

We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga_1-xMn_x As films using polarized neutron reflectometry. In addition to increasing the total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.

Original language	English (US)
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	69
Issue number	8
DOIs	https://doi.org/10.1103/PhysRevB.69.081307
State	Published - 2004
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Online availability

10.1103/PhysRevB.69.081307

Library availability

Discover UIUC Full Text

Cite this

@article{5ea4108e14a940a19f06977101e64adc,

title = "Annealing-dependent magnetic depth profile in Ga1-xMnx As",

abstract = "We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga1-xMnx As films using polarized neutron reflectometry. In addition to increasing the total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.",

author = "Kirby, {B. J.} and Borchers, {J. A.} and Rhyne, {J. J.} and {Te Velthuis}, {S. G.E.} and A. Hoffmann and O{\textquoteright}donovan, {K. V.} and T. Wojtowicz and X. Liu and Lim, {W. L.} and Furdyna, {J. K.}",

year = "2004",

doi = "10.1103/PhysRevB.69.081307",

language = "English (US)",

volume = "69",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Institute of Physics",

number = "8",

}

TY - JOUR

T1 - Annealing-dependent magnetic depth profile in Ga1-xMnx As

AU - Kirby, B. J.

AU - Borchers, J. A.

AU - Rhyne, J. J.

AU - Te Velthuis, S. G.E.

AU - Hoffmann, A.

AU - O’donovan, K. V.

AU - Wojtowicz, T.

AU - Liu, X.

AU - Lim, W. L.

AU - Furdyna, J. K.

PY - 2004

Y1 - 2004

N2 - We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga1-xMnx As films using polarized neutron reflectometry. In addition to increasing the total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.

AB - We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga1-xMnx As films using polarized neutron reflectometry. In addition to increasing the total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.

UR - http://www.scopus.com/inward/record.url?scp=4444271841&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4444271841&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.69.081307

DO - 10.1103/PhysRevB.69.081307

M3 - Article

AN - SCOPUS:4444271841

SN - 1098-0121

VL - 69

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 8

ER -