Annealing-dependent magnetic depth profile in Ga1-xMnx As

B. J. Kirby, J. A. Borchers, J. J. Rhyne, S. G.E. Te Velthuis, A. Hoffmann, K. V. O’donovan, T. Wojtowicz, X. Liu, W. L. Lim, J. K. Furdyna

Research output: Contribution to journalArticlepeer-review


We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga1-xMnx As films using polarized neutron reflectometry. In addition to increasing the total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.

Original languageEnglish (US)
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number8
StatePublished - 2004
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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